Surface Analysis
Surface characterization techniques at the nanoscale
Nanofilm Technologies
Singapore, Singapore
Advanced materials and nanofabrication company specializing in surface solutions and precision coating technologies
Nanotec Electronica
Madrid, Spain
Developer of scanning probe microscope systems and control electronics
Park Systems
Suwon, South Korea
World-leading manufacturer of atomic force microscope systems for research and industry
Asylum Research
Santa Barbara, United States
Designer and manufacturer of atomic force microscopes for materials and bioscience research
Aculon
San Diego, United States
Developer of ultra-thin molecular coatings for water repellency and corrosion protection
Nanotec Srl
Milan, Italy
Italian nanotechnology company specializing in protective coatings and surface treatments
Plasmachem
Berlin, Germany
German manufacturer of nanodiamonds and specialty nanoparticles
Nanonis
Zurich, Switzerland
Swiss developer of high-end control systems for scanning probe microscopy
Anasys Instruments
Santa Barbara, United States
Pioneer in nanoscale infrared spectroscopy (AFM-IR)
Anton Paar
Graz, Austria
Austrian manufacturer of analytical instruments including nanoindentation and surface analysis
Microtrac
Montgomeryville, United States
US manufacturer of particle characterization instruments for nanomaterials
Zetasizer (Malvern)
Malvern, United Kingdom
World leader in nanoparticle and zeta potential characterization
Tescan
Brno, Czech Republic
Czech manufacturer of electron microscopes and FIB-SEM systems
Ellipsometry Solutions
Lincoln, United States
World leader in spectroscopic ellipsometry for thin film characterization
Hysitron (Bruker)
Eden Prairie, United States
Pioneer in nanomechanical testing and nanoindentation systems
Budget Sensors
Sofia, Bulgaria
Cost-effective manufacturer of AFM probes and cantilevers
MikroMasch
Tallinn, Estonia
Manufacturer of SPM probes and calibration gratings
NanoFocus
Oberhausen, Germany
Developer of optical 3D surface metrology systems
Sensofar
Terrassa, Spain
Developer of 3D optical profilers for surface metrology
Zygo Corporation
Middlefield, United States
Global leader in optical metrology for precision manufacturing
4D Technology
Tucson, United States
Developer of dynamic interferometry for surface metrology
Danish Technological Institute
Aarhus, Denmark
Applied research in nanotechnology and surface engineering
Horiba Scientific Nano
Kyoto, Japan
Nanoparticle characterization instruments
Rigaku
Tokyo, Japan
X-ray analytical instrumentation
NanoWorld AG
Neuchâtel, Switzerland
AFM probes and cantilevers manufacturer
SilcoTek
Bellefonte, United States
CVD silicon-based coatings for chemical inertness and corrosion resistance
Particular Sciences
Dublin, Ireland
Nanoparticle and microparticle characterization and synthesis services
Nanoand More GmbH
Wetzlar, Germany
AFM probes and consumables for scanning probe microscopy
Nanosensors
Neuchatel, Switzerland
High-quality AFM probes and specialty tips
Molecular Vista
San Jose, United States
Photo-induced force microscopy for nanoscale chemical imaging
Zygo Corporation
Middlefield, United States
Optical metrology for nanometer-scale measurement
Cameca (AMETEK)
Gennevilliers, France
Atom probe tomography and SIMS for nanoscale analysis
Hiden Analytical
Warrington, United Kingdom
Quadrupole mass spectrometers and SIMS systems
ION-TOF GmbH
Munster, Germany
Time-of-flight SIMS for nanoscale surface analysis
Specs GmbH
Berlin, Germany
Surface analysis instruments including XPS, UPS, LEED
Scienta Omicron
Taunusstein, Germany
Surface science and photoelectron spectroscopy systems
Prevac
Rogow, Poland
UHV surface science systems and components
RHK Technology
Troy, United States
STM systems and SPM control electronics
Unisoku Co.
Osaka, Japan
Cryogenic STM and scanning probe systems
Anton Paar TriTec
Peseux, Switzerland
Nano scratch and indentation testing systems
Olympus Scientific Solutions
Tokyo, Japan
Industrial microscopy and NDT solutions
CAN GmbH
Hamburg, Germany
Nanoparticle analysis and consulting services
Scanwel
Bangor, United Kingdom
Vacuum systems for thin film deposition
Bruker Nano Surfaces
Santa Barbara, United States
AFM, stylus profilers, and tribometers
AIST-NT
Zelenograd, Russia
AFM and scanning near-field optical microscopy
Anasys Instruments (Bruker)
Santa Barbara, United States
Nano-IR and AFM-IR spectroscopy systems, acquired by Bruker
Digital Surf
Besançon, France
Surface analysis software for microscopy and profilometry
Malvern Panalytical
Malvern, United Kingdom
Nanoparticle characterization instruments
Anton Paar Nano
Graz, Austria
Nano-characterization and measurement
Microtrac MRB
Montgomeryville, United States
Particle size and shape analyzers
SPECS Surface Nano Analysis
Berlin, Germany
Surface science and nanoscale analysis
Createc Fischer
Erligheim, Germany
Low-temperature STM and nanofabrication
NanoMagnetics Instruments
Oxford, United Kingdom
Atomic force microscopy for research applications
Nanoscope Systems
Daejeon, South Korea
Atomic force microscopes for research and industry
Nanotechnology Systems (NaioAFM)
Liestal, Switzerland
Affordable AFM for education and quality control
RHK Technology
Troy, United States
Ultra-high vacuum STM and AFM systems
NanoLab Technologies
Milpitas, United States
Nanoscale failure analysis and characterization
Metrohm Autolab
Utrecht, Netherlands
Electrochemistry instrumentation for nanomaterials research
Promimic
Gothenburg, Sweden
HAnano Surface hydroxyapatite coating for dental and orthopedic implants
NanoTech Coatings
Miami, United States
Industrial anti-corrosive and protective nanocoatings