E
Ellipsometry Solutions
Lincoln, United States
Founded 1987
Nanometrology Nanospectroscopy Nanocharacterization Surface Analysis Thin Film Deposition Nano-optics
About
World leader in spectroscopic ellipsometry for thin film characterization
Company Details
- Type
- commercial
- Employees
- 100-200
- Funding
- Private
Key Products
- M-2000
- VASE
- alpha-SE